Located near the University Town of Shenzhen, surrounded by dozens of HighTech industry development parks, Triyia Technology Ltd, a former semiconductor analysis and consultant company, a leading FIB Focused Ion Beam & SEM Scanned Electron Microscope lab service provider dedicated to semiconductor technology for nanoelectronics, is a well established research and development partner for industry and public institutions.
Yes! Whenever you come, we always have tea ready to serve, because Confucius saying "a friend coming from afar, how happy we are!" it is our mentality, we love to meet you here, with our combined experience of more than 40 years in the reverse engineering business, we are sure the outcome will be more delightful.
Or you do not have to come, because our years of experience serving the international partners in the semiconductor sector around the world, we know many of chips inside out, we can have seamless cooperation with you, just give us your FIB or SEM project, we accomplish the mission perfectly the same as you come, after you succeed in your business, tea will be served whenever you come, you will be our delightful friend, because we do warm business. Tea is nothing about technology, it's about people having it.
Package decap. for removing the plastic molding compound and exposing the silicon die, while keeping wires and other Cu or gold conductors intact to preserve chip function. We also can do die removal from a package. Chemical Etching Services Jet etching Manual cavity etching Total package removal Laser Decap. Services
Integrated circuit teardown service make heavy use of the deprocessing, cross-sectioning, and electron microscopy. Applications including circuit extraction and reverse engineering of obsolete parts, identifying patent infringement, gathering competitive intelligence in preparation for new product launches
Focused Ion Beam (FIB) circuit editing services to optimize the IC design. Advanced FEI-IET FIB system can obtain excellent resolution images of metal layers which helps to give a successful circuit edits including design analysis, modification, design debugging, design verification and Circuit isolation
Failure analysis plays a key role in improving products quality by determining the root cause of failure and working out the means for correcting and preventing current or future problems. Local cross sectioning, depassivation, and in situ secondary electron inspection identifies the nature of failure such as voids, cracks and particles.
Prototype microelectronic designs are used in functional testing, verification of the specification and for evaluating designs. We support you in processing nanosized structures to get designs such as contacts, vias, poly, diffusion etc., and offer low-cost ASIC prototypes. Individual customer designs are pooled together and then manufactured.
Our Laser Decapsulation Station etching out our logo on the chip. Laser decap is often assisted with acid decapsultion to achieve better results.
The silicon wafer was taken out for FIB - Focused Ion Beam processing, then rebonded to a PCB for programmer access or other processing.
FIB - Focused Ion Beam station processing: adding testing points, cutting of the metal line, new metal line deposit etc.
Afer the chip decap and delayering process, SEM - Scanned Electron Microscope microphotoed each layer and extracting designs of the Metal, Poly, Vias layers etc.
Afer the chip decap, OM - Optical Microscope taking photo of the substrate
A video of microcontroller decasulation, optical microscope zoom and Scanned Electron Microscope zoom
Show the QRcode to the taxi driver, or scan it with your Wechat app for driving or subway navigation while you are in China, it will be very easy for you to get our office location for directions. Google map is banned here. Click and hold the QR code photo for a while, save it to your mobile photo album for handy use.
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Monday-Friday : 09:00–18:00
Saturday am : 09:00–12:00
Saturday pm & Sunday - Close
Phone : +86-755-8666-5845 or 8666-5846
Fax : +86-755-8666-5846
triyia (a) outlook.com
Reverse Engineering Consult
With our years of experience in the FIB & SEM industry, working with design firms, reverse engineering companies, high-tech solution experts and universities, We have connections with almost the whole industry, if you have any needs, we can give you reverse engineer advise for free, just hope we can help in some way.